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1

A Framework for Sustaining Innovation at Baker Library, Harvard Business School

Dolan, Meghan, Hemment, Michael, Oliver, Stephanie

Journal:

New Review of Academic Librarianship

Année:

2017

Langue:

english

Fichier:

PDF, 1.23 MB

english, 2017

2

Experiential AI

Hemment, Drew, Aylett, Ruth, Belle, Vaishak, Murray-Rust, Dave, Luger, Ewa, Hillston, Jane, Rovatsos, Michael, Broz, Frank

Journal:

Année:

2019

Langue:

english

Fichier:

PDF, 1.54 MB

english, 2019

3

Creative Assemblages: Organisation and Outputs of Practice-Led Research

Wilkie, Alex, Gaver, William, Hemment, Drew, Giannachi, Gabriella

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 508 KB

english, 2010

4

Characterisation of emitter/base leakage currents in SiGe HBTs produced using selective epitaxy

A.C Lamb, J.F.W Schiz, J.M Bonar, F Cristiano, P Ashburn, S Hall, P.L.F Hemment

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 459 KB

english, 2001

5

Structure and composition of native oxides on GaAs

B.J. Sealy, P.L.F. Hemment

Journal:

Thin Solid Films

Année:

1974

Langue:

english

Fichier:

PDF, 244 KB

english, 1974

6

Soviet-Style Neoliberalism?

Journal:

Problems of Post-Communism

Année:

2009

Langue:

english

Fichier:

PDF, 2.46 MB

english, 2009

7

Book Reviews : The Changing Faces of Russian Women's Studies: Rosalind Marsh (ed.) Women in Russia and Ukraine Cambridge: Cambridge University Press, 1996, vii + 350 pp., ISBN 0-521-49872-4 Sue Bridger, Rebecca Kay and Kathryn Pinnick No More Heroines? Russia, Women and the Market London and NewYork: Routledge, 1996, v + 220 pp., ISBN 0-415-12460-3 Hilary Pilkington (ed.) Gender, Generation and Identity in Contemporary Russia London and New York: Routledge, 1996, vii + 306 pp., ISBN 0-415-13544-3 Mary Buckley (ed.) Post-Soviet Women: From the Baltic to Central Asia Cambridge: Cambridge University Press, 1997, vii + 316 pp., ISBN 0-521-56530-8

Uspenskaya, V., Hemment, J.

Journal:

European Journal of Women's Studies

Année:

1998

Langue:

english

Fichier:

PDF, 376 KB

english, 1998

8

The effects of different implantation and annealing temperatures on the structural and chemical properties of high dose oxygen-ion-implanted silicon

C.G. Tuppen, M.R. Taylor, P.L.F. Hemment, R.P. Arrowsmith

Journal:

Thin Solid Films

Année:

1985

Langue:

english

Fichier:

PDF, 2.36 MB

english, 1985

9

Precipitation of oxygen in single-crystal silicon implanted with high doses of oxygen

P.L.F. Hemment, E.A. Maydell-Ondrusz, J.E. Castle, R. Paynter, M.C. Wilson, R.G. Booker, J.A. Kilner, R.P. Arrowsmith

Journal:

Thin Solid Films

Année:

1985

Langue:

english

Fichier:

PDF, 549 KB

english, 1985

10

Processing of titanium films on silicon using a Q-switched ruby laser

E. Maydell-Ondrusz, P.L.F. Hemment, K.G. Stephens

Journal:

Thin Solid Films

Année:

1986

Langue:

english

Fichier:

PDF, 432 KB

english, 1986

11

Depth profiles of the optical properties of buried oxides (SIMOX) by ellipsometry

M. Levy, E. Scheid, S. Cristoloveanu, P. Hemment

Journal:

Thin Solid Films

Année:

1987

Langue:

english

Fichier:

PDF, 428 KB

english, 1987

12

Modelling of 18O tracer studies of the oxygen redistribution during formation of SiO2 layers by high dose implantation

H.U. Jager, J.A. Kilner, R.J. Chater, P.L.F. Hemment, R.F. Peart, K.J. Reeson

Journal:

Thin Solid Films

Année:

1988

Langue:

english

Fichier:

PDF, 504 KB

english, 1988

13

Mechanism of buried β-SiC formation by implanted carbon in silicon

K.J. Reeson, J. Stoemenos, P.L.F. Hemment

Journal:

Thin Solid Films

Année:

1990

Langue:

english

Fichier:

PDF, 2.89 MB

english, 1990

14

A comparison of the behaviour of Si0.5Ge0.5 alloy during dry and wet oxidation

J.P. Zhang, P.L.F. Hemment, S.M. Newstead, A.R. Powell, T.E. Whall, E.H.C. Parker

Journal:

Thin Solid Films

Année:

1992

Langue:

english

Fichier:

PDF, 352 KB

english, 1992

15

Characterization of GaAs thin films grown by molecular beam epitaxy on Si-on-insulator

Zhu Wenhua, Lin Chenglu, Yu Yuehui, Li Aizhen, Zou Shichang, PLF Hemment

Journal:

Année:

1991

Langue:

english

Fichier:

PDF, 117 KB

english, 1991

16

Suppression of boron transient enhanced diffusion in silicon and silicon germanium by fluorine implantation

H.A.W. El Mubarek, Y. Wang, R. Price, J.M. Bonar, J. Zhang, P.L.F. Hemment, P. Ashburn

Journal:

Materials Science in Semiconductor Processing

Année:

2005

Langue:

english

Fichier:

PDF, 474 KB

english, 2005

17

Silicon on insulator optical waveguides formed by direct wafer bonding

G.T. Reed, Li Jinhua, C.K. Tang, Lin Chenglu, P.L.F. Hemment, A.G. Rickman

Journal:

Materials Science and Engineering: B

Année:

1992

Langue:

english

Fichier:

PDF, 373 KB

english, 1992

18

Raised source/drains for 50 nm MOSFETs using a silane/dichlorosilane mixture for selective epitaxy

A.M. Waite, N.S. Lloyd, K. Osman, W. Zhang, T. Ernst, H. Achard, Y. Wang, S. Deleonibus, P.L.F. Hemment, D.M. Bagnall, A.G.R. Evans, P. Ashburn

Journal:

Solid-State Electronics

Année:

2005

Langue:

english

Fichier:

PDF, 330 KB

english, 2005

19

An effect of poor vacuum conditions on the analysis of thin films by Rutherford backscattering

P.L.F. Hemment, J.F. Singleton, K.G. Stephens

Journal:

Thin Solid Films

Année:

1975

Langue:

english

Fichier:

PDF, 202 KB

english, 1975

20

Effect of fluorine implantation dose on boron transient enhanced diffusion and boron thermal diffusion in Si1-xGex

Mubarek, H.A.W.E., Karunaratne, M., Bonar, J.M., Dilliway, G.D., Wang, Y., Hemment, P.L.F., Willoughby, A.F., Ashburn, P.

Journal:

IEEE Transactions on Electron Devices

Année:

2005

Langue:

english

Fichier:

PDF, 1.17 MB

english, 2005

21

The Riddle of the Third Sector: Civil Society, International Aid, and NGOs in Russia

Journal:

Anthropological Quarterly

Année:

2004

Langue:

english

Fichier:

PDF, 2.58 MB

english, 2004

22

Pacific Rim New Media Summit Companion || Locative Arts

Journal:

Année:

2006

Langue:

english

Fichier:

PDF, 2.39 MB

english, 2006

23

[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Raised source/drain (RSD) for 50nm MOSFETs - effect of epitaxy layer thickness on short channel effects

Waite, A.M., Lloyd, N.S., Ashburn, P., Evans, A.G.R., Ernst, T., Achard, H., Deleonibus, S., Wang, Y., Hemment, P.

Année:

2003

Langue:

english

Fichier:

PDF, 273 KB

english, 2003

24

Effect of fluorine implantation dose on boron thermal diffusion in silicon

El Mubarek, H. A. W., Bonar, J. M, Dilliway, G. D., Ashburn, P., Karunaratne, M., Willoughby, A. F., Wang, Y., Hemment, P. L. F., Price, R., Zhang, J., Ward, P.

Journal:

Journal of Applied Physics

Année:

2004

Langue:

english

Fichier:

PDF, 429 KB

english, 2004

25

Investigation of Trapping Properities in Simox Films by Photo-Induced Current Transient Spectroscopy

Papaioannou, G., Ioannou-Sougleridis, V., Cristoloveanu, S., Bruel, M., Hemment, P.L.F.

Journal:

Materials Science Forum

Année:

1989

Fichier:

PDF, 287 KB

1989

26

Dose Dependence of Defects in Silicon Produced by High Dose, High Temperature O+ Implantation

Hobbs, A., Barklie, R.C., Reeson, K.J., Hemment, P.L.F.

Journal:

Materials Science Forum

Année:

1986

Fichier:

PDF, 283 KB

1986

27

The Riddle of the Third Sector: Civil Society, International Aid, and NGOs in Russia

Journal:

Anthropological Quarterly

Année:

2004

Langue:

english

Fichier:

PDF, 659 KB

english, 2004

28

Red Scares and Orange Mobilizations: A Critical Anthropological Perspective on the Russian Hacking Scandal

Journal:

Année:

2017

Langue:

english

Fichier:

PDF, 609 KB

english, 2017

29

Nashi, Youth Voluntarism, and Potemkin NGOs: Making Sense of Civil Society in Post-Soviet Russia

Journal:

Année:

2012

Langue:

english

Fichier:

PDF, 2.09 MB

english, 2012

30

Toward Fairness, Morality and Transparency in Artificial Intelligence through Experiential AI

Hemment, Drew, Belle, Vaishak, Aylett, Ruth, Murray-Rust, Dave, Pschetz, Larissa, Broz, Frank

Journal:

Année:

2019

Fichier:

PDF, 5.56 MB

2019

31

Ge+ ion implantation — a competing technology?

P.L.F. Hemment, F. Cristiano, A. Nejim, S. Lombardo, K.K. Larssen, F. Priolo, R.C. Barklie

Journal:

Journal of Crystal Growth

Année:

1995

Langue:

english

Fichier:

PDF, 1.01 MB

english, 1995

32

Rutherford backscatter technique as applied to thin (transparent) specimens

P.L.F. Hemment, A.W. Tinsley

Journal:

Nuclear Instruments and Methods

Année:

1971

Langue:

english

Fichier:

PDF, 84 KB

english, 1971

33

Defect introduction rates and defect identification studies in low-energy electron irradiated silicon

P.L.F. Hemment, P.R.C. Stevens

Journal:

Nuclear Instruments and Methods

Année:

1971

Langue:

english

Fichier:

PDF, 452 KB

english, 1971

34

Carrier compensation in O+ implanted n-type GaAs

T. Asano, P.L.F. Hemment

Journal:

Solid-State Electronics

Année:

1980

Langue:

english

Fichier:

PDF, 136 KB

english, 1980

35

Effects of electric field on photoconductive frequency resolved spectroscopy: Analysis of silicon-on-insulator structures

F. Coromina, A. Pérez-Rodríguez, J.R. Morante, J. Macía, M.A. Lourenço, K.P. Homewood, P.L.F. Hemment

Journal:

Solid-State Electronics

Année:

1992

Langue:

english

Fichier:

PDF, 473 KB

english, 1992

36

Oxygen distributions in synthesized SiO2 layers formed by high dose O+ implantation into silicon

PLF Hemment, E Maydell-Ondrusz, KG Stevens, JA Kilner, J Butcher

Journal:

Année:

1984

Langue:

english

Fichier:

PDF, 579 KB

english, 1984

37

Silicon on insulator structures formed by ion implantation

Journal:

Année:

1985

Langue:

english

Fichier:

PDF, 143 KB

english, 1985

38

Ion beam synthesis of thin buried layers of SiO2 in silicon

PLF Hemment, KJ Reeson, JA Kilner, RJ Chater, C Marsh, GR Booker, GK Celler, J Stoemenos

Journal:

Année:

1986

Langue:

english

Fichier:

PDF, 590 KB

english, 1986

39

Formation mechanism and structures of buried oxy-nitride layers produced by ion beam synthesis

KJ Reeson, PLF Hemment, JA Kilner, RJ Chater, CD Meekison, C Marsch, GR Booker, JR Davis

Journal:

Année:

1986

Langue:

english

Fichier:

PDF, 453 KB

english, 1986

40

Microstructure of silicon-on-insulator structures produced by high dose nitrogen implantation of silicon

CD Meekison, GR Booker, KJ Reeson, PLF Hemment, RJ Chater, JA Kilner, JR Davis

Journal:

Année:

1986

Langue:

english

Fichier:

PDF, 559 KB

english, 1986

41

Preface

JA Kilner, KJ Reeson, PLF Hemment

Journal:

Année:

1991

Langue:

english

Fichier:

PDF, 81 KB

english, 1991

42

Simox bibliography

PLF Hemment, KJ Reeson, JA Kilner, SJ Krause

Journal:

Année:

1991

Langue:

english

Fichier:

PDF, 4.03 MB

english, 1991

43

Delineation of defects in SIMOX structures using a chemical etching technique

L F Giles, A Nejim, P L F Hemment, T W Fan

Journal:

Année:

1992

Langue:

english

Fichier:

PDF, 368 KB

english, 1992

44

Formation of buried insulating layers in silicon by the implantation of high doses of oxygen

P.L.F. Hemment, E. Maydell-Ondrusz, K.G. Stephens, J. Butcher, D. Ioannou, J. Alderman

Journal:

Nuclear Instruments and Methods in Physics Research

Année:

1983

Langue:

english

Fichier:

PDF, 534 KB

english, 1983

45

Ion beam dosimetry by Rutherford backscattering with continuous rotation of the sample

P.L.F. Hemment, E.A. Maydell-Ondrusz, K.G. Stephens

Journal:

Nuclear Instruments and Methods in Physics Research

Année:

1983

Langue:

english

Fichier:

PDF, 306 KB

english, 1983

46

SIMS analysis of silicon on insulator structures formed by high-dose O+ implantation into silicon

J.A. Kilner, S.D. Littlewood, P.L.F. Hemment, E. Maydell-Ondrusz, K.G. Stephens

Journal:

Nuclear Instruments and Methods in Physics Research

Année:

1983

Langue:

english

Fichier:

PDF, 372 KB

english, 1983

47

Electrical and optical characterisation of double SIMOX structures formed by sequential high energy oxygen implantation into silicon

N. Hatzopoulos, D. Panknin, W. Fukarek, W. Skorupa, D.I. Siapkas, P.L.F. Hemment

Journal:

Microelectronic Engineering

Année:

1995

Langue:

english

Fichier:

PDF, 353 KB

english, 1995

48

Optical and compositional studies of buried oxide layers in silicon formed by high dose implantation

R.J. Chater, J.A. Kilner, E. Scheid, S. Cristoloveneau, P.L.F. Hemment, K.J. Reeson

Journal:

Applied Surface Science

Année:

1987

Langue:

english

Fichier:

PDF, 353 KB

english, 1987

49

Defect production during the fabrication of SOI by oxygen ion implantation

R.C. Barklie, T.J. Ennis, K. Reeson, P.L.F. Hemment

Journal:

Applied Surface Science

Année:

1989

Langue:

english

Fichier:

PDF, 464 KB

english, 1989

50

Temperature dependence and non-uniformity of electrical properties of SOI films obtained by oxygen implantation

S. Cristoloveanu, J. Wyncoll, P. Spinelli, P.L.F. Hemment, R.P. Arrowsmith

Journal:

Année:

1985

Langue:

english

Fichier:

PDF, 299 KB

english, 1985